Home /
Physics /
Physics Experiments /
Solid-state physics /
Properties of crystals /
X-ray scattering /
Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

VP7.1.2.4
Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

Details

This product contains dangerous substances!

Print page

Technical Service & Support:

Online Service Portal
Do you have any questions or suggestions regarding our devices, products, experiments, equipment sets or about our software? You need spare parts? FORM

Repair Service
You would like to register a repair? FORM

Europe

For European distributors, please visit: European distributors

Worldwide requests

Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

Contact Us