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Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples /
Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

VP7.1.2.4

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Description

The experiment P7.1.2.4 records the Debye-Scherrer pattern with an end window counter instead of X-ray film. The diffracted reflections of a fine powder sample are recorded as a function of diffraction angle. The intensity peaks in the diffraction spectrum allow the calculation of the separations of adjacent lattice planes.

Components of equipment sets

1	554800	X-ray apparatus
1	554862 8	X-ray tube, Cu
1	554831 8	Goniometer
1	55901 8	End-window counter with cable for α, β, γ and X-rays
1	554842 8	Crystal powder holder
1	667091 4	Pestle 88 mm
1	667092 4	Mortar 30 ml, 56 mm x 36 mm
1	666960 8	Powder spatula, stainless steel, 150 mm
1	6735700 4	Sodium chloride, 250 g
1	6730520 4	Lithium fluoride, analytically pure, 10 g Danger H301 H335 H315 H319
1		additionally required: PC with Windows XP/Vista/7/8/10 (x86 or x64)

Experiment Instructions

PDF (Experiment description)

P7.1.2.4 Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

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Debye-Scherrer Scan: determining the lattice plane spacings of polycrystalline powder samples

Description

Components of equipment sets

Experiment Instructions

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